ISO 22489-2006 微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品
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【英文标准名称】:Microbeamanalysis-Electronprobemicroanalysis-Quantitativepointanalysisforbulkspecimensusingwavelength-dispersiveX-rayspectroscopy
【原文标准名称】:微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品
【标准号】:ISO22489-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-12
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC202
【标准类型】:()
【标准水平】:()
【中文主题词】:分析;分析方法;块状物料;电子束;微量分析;参数;定量的;定量分析;光谱学;波长色散
【英文主题词】:Analysis;Analysismethods;Bulkmaterials;Electronbeams;Methodsofanalysis;Microanalysis;Parameters;Quantitative;Quantitativeanalysis;Spectroscopy;Wavelengthdispersive
【摘要】:ThisInternationalStandardspecifiesrequirementsforthequantificationofelementsinamicrometre-sizedvolumeofaspecimenidentifiedthroughanalysisoftheX-raysgeneratedbyanelectronbeamusingawavelength-dispersivespectrometer(WDS)fittedeithertoanelectronprobemicroanalyserortoascanningelectronmicroscope(SEM).Itdescribes:—theprincipleofthequantitativeanalysis;—thegeneralcoverageofthistechniqueintermsofelements,massfractionsandreferencespecimens;—thegeneralrequirementsfortheinstrument;—thefundamentalproceduresinvolved,suchasspecimenpreparation,selectionofexperimentalconditions,themeasurements,theanalysisoftheseandthereport.ThisInternationalStandardisintendedforthequantitativeanalysisofaflatandhomogeneousbulkspecimenusinganormalincidencebeam.Itdoesnotspecifydetailedrequirementsforeithertheinstrumentsorthedatareductionsoftware.Operatorsshouldobtaininformationsuchasinstallationconditions,detailedproceduresforoperationandspecificationoftheinstrumentfromthemakersofanyproductsused.
【中国标准分类号】:G04
【国际标准分类号】:71_040_50
【页数】:14P.;A4
【正文语种】:英语
【原文标准名称】:微光束分析.电子探针微量分析.运用波长色散X射线光谱测量法定量分析块状样品
【标准号】:ISO22489-2006
【标准状态】:现行
【国别】:国际
【发布日期】:2006-12
【实施或试行日期】:
【发布单位】:国际标准化组织(IX-ISO)
【起草单位】:ISO/TC202
【标准类型】:()
【标准水平】:()
【中文主题词】:分析;分析方法;块状物料;电子束;微量分析;参数;定量的;定量分析;光谱学;波长色散
【英文主题词】:Analysis;Analysismethods;Bulkmaterials;Electronbeams;Methodsofanalysis;Microanalysis;Parameters;Quantitative;Quantitativeanalysis;Spectroscopy;Wavelengthdispersive
【摘要】:ThisInternationalStandardspecifiesrequirementsforthequantificationofelementsinamicrometre-sizedvolumeofaspecimenidentifiedthroughanalysisoftheX-raysgeneratedbyanelectronbeamusingawavelength-dispersivespectrometer(WDS)fittedeithertoanelectronprobemicroanalyserortoascanningelectronmicroscope(SEM).Itdescribes:—theprincipleofthequantitativeanalysis;—thegeneralcoverageofthistechniqueintermsofelements,massfractionsandreferencespecimens;—thegeneralrequirementsfortheinstrument;—thefundamentalproceduresinvolved,suchasspecimenpreparation,selectionofexperimentalconditions,themeasurements,theanalysisoftheseandthereport.ThisInternationalStandardisintendedforthequantitativeanalysisofaflatandhomogeneousbulkspecimenusinganormalincidencebeam.Itdoesnotspecifydetailedrequirementsforeithertheinstrumentsorthedatareductionsoftware.Operatorsshouldobtaininformationsuchasinstallationconditions,detailedproceduresforoperationandspecificationoftheinstrumentfromthemakersofanyproductsused.
【中国标准分类号】:G04
【国际标准分类号】:71_040_50
【页数】:14P.;A4
【正文语种】:英语
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